Title:
Near-Field Optical Spectroscopy 近場光譜學
Near-Field Optical Spectroscopy 近場光譜學
Speaker:
黃瓊緯 (Chiung-Wei Huang), PhD student, UNC-Chapel Hil
黃瓊緯 (Chiung-Wei Huang), PhD student, UNC-Chapel Hil
Time:
09/28 (Sat.) 7 pm PDT, 8 pm MDT, 9 pm CDT, 10 pm EDT
09/29 (Sun.) 10 am Taiwan
09/28 (Sat.) 7 pm PDT, 8 pm MDT, 9 pm CDT, 10 pm EDT
09/29 (Sun.) 10 am Taiwan
Keywords:
Chemistry, Physical chemistry, Near-field, Optical characterization, Atomic force microscopy, Nanotechnology
Chemistry, Physical chemistry, Near-field, Optical characterization, Atomic force microscopy, Nanotechnology
Abstract:
本演講概述以掃描探針顯微鏡為基礎方法的近場光譜學,從技術需求背景到原理,再到近年應用於檢視材料中奈米尺度的異質結構與其光電特性。
I’d like to give an overview of near-field optical characterization based on scanning probe microscopy. The content will be presented from the technical need for the emerging materials and followed by the experimental principle. Several recent examples on investigating nanoscale heterogeneity and the associated optoelectronic properties will be discussed.